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Эмс-тест для производителей чипов и полупроводников Эмс-тест для производителей чипов и полупроводников

Введение в систему

EVERFINE предоставляет комплексные профессиональные тесты EMC для производителей чипов и полупроводников. Решения включают: ETP-2-HBM/MM ESD test system, F-CDM_3kV ESD test system и т.д., которые соответствуют различным международным и национальным стандартам.
Everfine
Everfine

ESD(Electrostatic Discharge) Immunity Test-HBM(Human-Body Model)/MM(Machine Model) Up To 8kV/400V

EVERFINE's ETP-2-HBM/MM ESD TEST MODEL is designed with different ESD immunity test requirements for HBM and MM conditions, and it provides specific test platforms for HBM and MM. This product complies with various international standards, which include ANSI/ESDA/JEDEC JS-001-2017, ACE-Q100-002-REV-E, MIL-STD-883K, GJB548B-2005, AEC-Q100-003E, ANSI/ESD STM5.2, JESD22-A115C. ETP-2-HBM/MM ESD TEST MODEL is composed of EMS61000-2A electrostatic discharge generator and ETP-2 electrostatic test platform, and it can apply to various semiconductor devices(LED,LED chip,transistor and IC)
Everfine
Everfine

ESD Immunity Test F-CDM, Up to 2kV

Charged Device Model (CDM) is the ESD model that simulates the integrated circuit electrostatic discharge, and this ESD event often happens during the integrated circuit assembly process. F-CDM test system strictly follows ANSI/ESDA/JEDEC JS-002-2018, AEC_Q100_011, and AEC_Q101-005 standards. The whole system is designed explicitly for the CDM simulation. F-CDM comprises an ultra-microscope, automatic controller, and CDM module; it provides high accuracy, high resolution, and excellent stability.
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